To view this video please enable JavaScript, and consider upgrading to a web browser that supports HTML5 video Video 2 Movie S2. Estimation of the depth of 40-nm fluorescent beads located on a glass slope by fitting the TIRF intensity model to a stack of 41 images corresponding to angles ranging from 61° to 76°. Fast high-resolution 3D total internal reflection fluorescence microscopy by incidence angle scanning and azimuthal averaging Jérôme Boulanger, Charles Gueudry, Daniel Münch, Bertrand Cinquin, Perrine Paul-Gilloteaux, Sabine Bardin, Christophe Guérin, Fabrice Senger, Laurent Blanchoin, and Jean Salamero PNAS. 2014. 111:17164-17169 DOI: 10.1073/pnas.1414106111 Download Original Video Browse All Videos »